Dherbécourt, Pascal, Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, UMR 6634, Avenue de l’université B.P 12, 76800, France., France
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Vol 3 No 1 (2019) - Special issue : Reliability and performance of components and systems for power electronic applications
An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET
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