Dherbécourt, Pascal, Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, UMR 6634, Avenue de l’université B.P 12, 76800, France., France

  • Vol 3 No 1 (2019) - Special issue : Reliability and performance of components and systems for power electronic applications
    An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET
    Abstract  PDF