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Vol 3 No 1 (2019)
Published:
2019-02-15
Special issue : Reliability and performance of components and systems for power electronic applications
Preface
Guest Editors: Pr. Pascal Dherbécourt, Pr. Ahmed El Oualkadi
1 - 2
PDF
Secured Failure Analysis Methodology for Accurate Diagnostic of Defects in GaN HEMT Technologies
Jean-Guy TARTARIN
3 - 13
PDF
Experimental and microscopic analysis of 600V GaN-GIT under the short-circuit aging tests
Jianzhi FU
14 - 19
PDF
An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET
WADIA JOUHA, Pascal Dherbécourt, Ahmed El Oualkadi, Eric Joubert, Mohamed Masmoudi
20 - 25
PDF
A Hybrid TSA-Fuzzy Logic Approach to Detect Induction Motor Rotor Faults
abdennabi khiam, Nabil Ngote, Mohammed Ouassaid
26 - 35
PDF
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