Vol 3, No 1 (2019)

Table of Contents

Special issue : Reliability and performance of components and systems for power electronic applications

Preface
guest editors: pr. pascal dherbécourt, pr. ahmed el oualkadi
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1 - 2
Secured Failure Analysis Methodology for Accurate Diagnostic of Defects in GaN HEMT Technologies
jean-guy tartarin
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3 - 13
Experimental and microscopic analysis of 600V GaN-GIT under the short-circuit aging tests
jianzhi fu
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14 - 19
An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET
wadia jouha, pascal dherbécourt, ahmed el oualkadi, eric joubert, mohamed masmoudi
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20 - 25
A Hybrid TSA-Fuzzy Logic Approach to Detect Induction Motor Rotor Faults
abdennabi khiam, nabil ngote, mohammed ouassaid
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26 - 35